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[IEEE 2009 2nd International Workshop on Electron Devices and Semiconductor Technology (IEDST) - Mumbai, India (2009.06.1-2009.06.2)] 2009 2nd International Workshop on Electron Devices and Semiconductor Technology - Bias dependent and scalable small-signal modeling of pseudomorphic HEMTs

✍ Scribed by Verma, Amit Kumar; Chaturvedi, Sandeep; Bhat K., Mahadeva; Saravanan, G. Sai; Muralidharan, R.

Book ID: 118026106
Publisher: IEEE
Year: 2009
Weight: 522 KB
Volume: 0
Category: Article
ISBN: 1424438314
DOI: 10.1109/edst.2009.5166138

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