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[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Small Delay Fault Model for Intra-Gate Resistive Open Defects

✍ Scribed by Arai, Masayuki; Suto, Akifumi; Iwasaki, Kazuhiko; Nakano, Katsuyuki; Shintani, Michihiro; Hatayama, Kazumi; Aikyo, Takashi

Book ID: 120617082
Publisher: IEEE
Year: 2009
Weight: 829 KB
Category: Article
ISBN: 0769535984
DOI: 10.1109/VTS.2009.25

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