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[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - False Path Aware Timing Yield Estimation under Variability

✍ Scribed by Xie, Lin; Davoodi, Azadeh; Saluja, Kewal K.; Sinkar, Abhishek

No coin nor oath required. For personal study only.

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