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[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Recursive Path Selection for Delay Fault Testing

โœ Scribed by Chung, Jaeyong; Abraham, Jacob A.


Book ID
118164929
Publisher
IEEE
Year
2009
Weight
868 KB
Volume
0
Category
Article
ISBN
0769535984

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