✦ LIBER ✦

[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Compact Delay Test Generation with a Realistic Low Cost Fault Coverage Metric

✍ Scribed by Wang, Zheng; Walker, Duncan M.H.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2009 27th IEEE VLSI Test Symposium

✍ Chung, Jaeyong; Abraham, Jacob A. 📂 Article 📅 2009 🏛 IEEE ⚖ 868 KB

[IEEE 2009 27th IEEE VLSI Test Symposium

✍ Baba, Altug Hakan; Mitra, Subhasish 📂 Article 📅 2009 🏛 IEEE ⚖ 962 KB

[IEEE 2009 27th IEEE VLSI Test Symposium

✍ Goel, Sandeep Kumar; Devta-Prasanna, Narendra; Turakhia, Ritesh P. 📂 Article 📅 2009 🏛 IEEE ⚖ 747 KB

[IEEE 2009 27th IEEE VLSI Test Symposium

✍ Chen, Zhen; Xiang, Dong; Yin, Boxue 📂 Article 📅 2009 🏛 IEEE ⚖ 660 KB

[IEEE 2009 27th IEEE VLSI Test Symposium

✍ Shamshiri, Saeed; Cheng, Kwang-Ting 📂 Article 📅 2009 🏛 IEEE ⚖ 894 KB

[IEEE 2009 27th IEEE VLSI Test Symposium

✍ Arai, Masayuki; Suto, Akifumi; Iwasaki, Kazuhiko; Nakano, Katsuyuki; Shintani, M 📂 Article 📅 2009 🏛 IEEE ⚖ 829 KB