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[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Effective and Efficient Test Pattern Generation for Small Delay Defect

✍ Scribed by Goel, Sandeep Kumar; Devta-Prasanna, Narendra; Turakhia, Ritesh P.

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