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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - A reliability-aware RF power amplifier design for CMOS radio chip integration

✍ Scribed by Ruberto, Mark; Degani, Ofir; Wail, Shay; Tendler, Alex; Fridman, Amir; Goltman, Gennady

No coin nor oath required. For personal study only.

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