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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Contributions and limits of charge pumping measurement for addressing trap generation in high-k/SiO2 dielectric stacks

✍ Scribed by Rafik, M.; Ribes, G.; Ghibaudo, G.

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