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[IEEE 2008 72nd ARFTG Microwave Measurement Symposium - Portland, OR, USA (2008.12.9-2008.12.12)] 2008 72nd ARFTG Microwave Measurement Symposium - The influence of calibration substrate boundary conditions on CPW characteristics and calibration accuracy at mm-wave frequencies

✍ Scribed by Rumiantsev, Andrej; Doerner, Ralf; Godshalk, Edward M.

No coin nor oath required. For personal study only.

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