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[IEEE 2008 72nd ARFTG Microwave Measurement Symposium - Portland, OR, USA (2008.12.9-2008.12.12)] 2008 72nd ARFTG Microwave Measurement Symposium - Load-pull + NVNA = enhanced X-parameters for PA designs with high mismatch and technology-independent large-signal device models

✍ Scribed by Simpson, Gary; Horn, Jason; Gunyan, Daniel; Root, David E.

No coin nor oath required. For personal study only.

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