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[IEEE 2008 72nd ARFTG Microwave Measurement Symposium - Portland, OR, USA (2008.12.9-2008.12.12)] 2008 72nd ARFTG Microwave Measurement Symposium - RF waveform metrology for characterization of non-linear amplifiers

✍ Scribed by Humphreys, David A.; Watkins, Gavin; Morris, Kevin A.; Miall, James

Book ID: 121764639
Publisher: IEEE
Year: 2008
Weight: 966 KB
Category: Article
DOI: 10.1109/ARFTG.2008.4804285

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