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[IEEE 2008 72nd ARFTG Microwave Measurement Symposium - Portland, OR, USA (2008.12.9-2008.12.12)] 2008 72nd ARFTG Microwave Measurement Symposium - A general closed-form solution to multi-port scattering parameter calculations

✍ Scribed by Wittwer, Peter; Pupalaikis, Peter J.

Book ID: 121399960
Publisher: IEEE
Year: 2008
Weight: 940 KB
Category: Article
DOI: 10.1109/ARFTG.2008.4804295

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