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[IEEE 2008 72nd ARFTG Microwave Measurement Symposium - Portland, OR, USA (2008.12.9-2008.12.12)] 2008 72nd ARFTG Microwave Measurement Symposium - Comparison of on-wafer multiline TRL and LRM+ calibrations for RF CMOS applications

✍ Scribed by Rumiantsev, Andrej; Sweeney, Susan L.; Corson, Phillip L.

Book ID: 120180613
Publisher: IEEE
Year: 2008
Weight: 490 KB
Category: Article
DOI: 10.1109/ARFTG.2008.4804291

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