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[IEEE 2007 IEEE Symposium on VLSI Technology - Kyoto, Japan (2007.06.12-2007.06.14)] 2007 IEEE Symposium on VLSI Technology - High Performance Transistors Featured in an Aggressively Scaled 45nm Bulk CMOS Technology

✍ Scribed by Luo, Z.; Rovedo, N.; Ong, S.; Phoong, B.; Eller, M.; Utomo, H.; Ryou, C.; Wang, H.; Stierstorfer, R.; Clevenger, L.; Kim, S.; Toomey, J.; Sciacca, D.; Li, J.; Wille, W.; Zhao, L.; Teo, L.; Dyer, T.; Fang, S.; Yan, J.; Kwon, O.; Kwon, O.; Park, D.; Holt, J.; Han, J.; Chan, V.; Yuan, J.; Kebede, T.; Lee, H.; Kim, S.; Lee, S.; Vayshenker, A.; Yang, Z.; Tian, C.; Ng, H.; Shang, H.; Hierlemann, M.; Ku, J.; Sudijono, J.; Ieong, M.

Book ID: 111878524
Publisher: IEEE
Year: 2007
Tongue: Japanese
Weight: 588 KB
Volume: 0
Category: Article
ISBN: 4900784036
DOI: 10.1109/vlsit.2007.4339709

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