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[IEEE 2007 IEEE Symposium on VLSI Technology - Kyoto, Japan (2007.06.12-2007.06.14)] 2007 IEEE Symposium on VLSI Technology - Empirical Characteristics and Extraction of Overall Variations for 65-nm MOSFETs and Beyond

✍ Scribed by Kanno, Michihiro; Shibuya, Akira; Matsumura, Masao; Tamura, Kazuhiro; Tsuno, Hitoshi; Mori, Shigetaka; Fukuzaki, Yuzo; Gocho, Tetsuo; Ansai, Hisahiro; Nagashima, Naoki

Book ID: 111868136
Publisher: IEEE
Year: 2007
Tongue: Japanese
Weight: 717 KB
Volume: 0
Category: Article
ISBN: 4900784036
DOI: 10.1109/vlsit.2007.4339738

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