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[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Failure of On-Chip Power-Rail ESD Clamp Circuits During System-Level ESD Test

✍ Scribed by Yen, Cheng-Cheng; Ker, Ming-Dou

Book ID: 125462191
Publisher: IEEE
Year: 2007
Weight: 715 KB
Category: Article
ISBN-13: 9781424409198
DOI: 10.1109/relphy.2007.369969

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