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[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - A novel testing approach for full-chip CDM characterization

✍ Scribed by Gerdemann, Alex; Rosenbaum, Elyse; Stockinger, Michael

Book ID: 126746471
Publisher: IEEE
Year: 2007
Weight: 827 KB
Category: Article
ISBN: 158537136X
DOI: 10.1109/EOSESD.2007.4401765

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