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[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Pulse stress testing for ultra-thin MgO barrier magnetic tunnel junctions

✍ Scribed by Chuan-Fang Jiang, ; Hai-Ting Li, ; Zhao-Yu Teng, ; Gui-Fu Wang, ; Gang Xiao, ; Lu-Ge Yin, ; Yu Chen, ; Ge Yan, ; Li, William; Sidney Chou,

Book ID: 126594024
Publisher: IEEE
Year: 2007
Weight: 303 KB
Category: Article
ISBN: 158537136X
DOI: 10.1109/EOSESD.2007.4401740

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