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[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - T-diodes - a novel plug-and-play wideband RF circuit ESD protection methodology

✍ Scribed by Linten, D.; Thijs, S.; Borremans, J.; Dehan, M.; Tremouilles, D.; Scholz, M.; Natarajan, M.I.; Wambacq, P.; Groeseneken, G.

Book ID: 121336526
Publisher: IEEE
Year: 2007
Weight: 898 KB
Category: Article
ISBN: 158537136X
DOI: 10.1109/EOSESD.2007.4401759

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