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[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - ESD damage and solutions in tape head manufacturing

✍ Scribed by Lam, Michelle; Bookin, William; Czarnecki, Stanley; Golcher, Peter; Iben, Icko E. T.; Wo, Richard DJ

Book ID: 126630247
Publisher: IEEE
Year: 2007
Weight: 755 KB
Category: Article
ISBN: 158537136X
DOI: 10.1109/EOSESD.2007.4401744

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