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[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Universal Relationship between Low-Field Mobility and High-Field Carrier Velocity in High-K and SiO2 Gate Dielectric MOSFETs

✍ Scribed by Saitoh, Masumi; Uchida, Ken

Book ID: 125543624
Publisher: IEEE
Year: 2006
Weight: 368 KB
Category: Article
ISBN-13: 9781424404384
DOI: 10.1109/IEDM.2006.346757

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