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[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Challenges and Opportunities for High Performance 32 nm CMOS Technology

✍ Scribed by Sleight, J. W.; Lauer, I.; Dokumaci, O.; Fried, D. M.; Guo, D.; Haran, B.; Narasimha, S.; Sheraw, C.; Singh, D.; Steigerwalt, M.; Wang, X.; Oldiges, P.; Sadana, D.; Sung, C.Y.; Haensch, W.; Khare, M.

Book ID: 120219113
Publisher: IEEE
Year: 2006
Weight: 510 KB
Category: Article
ISBN-13: 9781424404384
DOI: 10.1109/IEDM.2006.346881

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