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[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Unexpected mobility degradation for very short devices : A new challenge for CMOS scaling

✍ Scribed by Cros, Antoine; Romanjek, Krunoslav; Fleury, Dominique; Harrison, Samuel; Cerutti, Robin; Coronel, Philippe; Dumont, Benjamin; Pouydebasque, Arnaud; Wacquez, Romain; Duriez, Blandine; Gwoziecki, Romain; Boeuf, Frederic; Brut, Hugues; Ghibaudo, Gerard; Skotnicki, Thomas

Book ID: 125834827
Publisher: IEEE
Year: 2006
Weight: 346 KB
Category: Article
ISBN-13: 9781424404384
DOI: 10.1109/IEDM.2006.346872

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