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[IEEE 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Arlington, VA, USA (2006.10.4-2006.10.4)] 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Implicit Critical PDF Test Generation with Maximal Test Efficiency

✍ Scribed by Christou, Kyriakos; Michael, Maria; Tragoudas, Spyros

Book ID: 126734233
Publisher: IEEE
Year: 2006
Weight: 217 KB
Category: Article
ISBN-13: 9780769527062
DOI: 10.1109/DFT.2006.34

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