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[IEEE 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Arlington, VA, USA (2006.10.4-2006.10.4)] 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - SET Fault Tolerant Combinational Circuits Based on Majority Logic

✍ Scribed by Michels, A.; Petroli, L.; Lisboa, C.A.L.; Kastensmidt, F.; Carro, L.

Book ID: 120072620
Publisher: IEEE
Year: 2006
Weight: 143 KB
Category: Article
ISBN-13: 9780769527062
DOI: 10.1109/DFT.2006.59

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