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[IEEE 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Arlington, VA, USA (2006.10.4-2006.10.4)] 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Modified Triple Modular Redundancy Structure based on Asynchronous Circuit Technique

✍ Scribed by Rui, Gong; Wei, Chen; Fang, Liu; Kui, Dai; Zhiying, Wang

Book ID: 126752124
Publisher: IEEE
Year: 2006
Weight: 189 KB
Category: Article
ISBN-13: 9780769527062
DOI: 10.1109/DFT.2006.44

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