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[IEEE 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Arlington, VA, USA (2006.10.4-2006.10.4)] 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - VLSI Implementation of a Fault-Tolerant Distributed Clock Generation

✍ Scribed by Ferringer, M.; Fuchs, G.; Steininger, A.; Kempf, G.

Book ID: 126902603
Publisher: IEEE
Year: 2006
Weight: 248 KB
Category: Article
ISBN-13: 9780769527062
DOI: 10.1109/dft.2006.67

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