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[IEEE 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Arlington, VA, USA (2006.10.4-2006.10.4)] 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Reliability Evaluation of Repairable/Reconfigurable FPGAs

✍ Scribed by Pontarelli, S.; Ottavi, M.; Vankamamidi, V.; Salsano, A.; Lombardi, F.

Book ID: 121012739
Publisher: IEEE
Year: 2006
Weight: 191 KB
Category: Article
ISBN-13: 9780769527062
DOI: 10.1109/DFT.2006.55

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