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[IEEE 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Arlington, VA, USA (2006.10.4-2006.10.4)] 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Testing Reversible 1D Arrays for Molecular QCA

✍ Scribed by Ma, X.; Huang, J.; Metra, C.; Lombardi, F.

Book ID: 120926319
Publisher: IEEE
Year: 2006
Weight: 203 KB
Category: Article
ISBN-13: 9780769527062
DOI: 10.1109/DFT.2006.63

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📜 SIMILAR VOLUMES

[IEEE 2006 21st IEEE International Sympo

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