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[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Threshold energy of neutron-induced single event upset as a critical factor

✍ Scribed by Yahagi, Y.; Ibe, E.; Takahashi, Y.; Saito, Y.; Eto, A.; Sato, M.; Kameyama, H.; Hidaka, M.; Terunuma, K.; Nunomiya, T.; Nakamura, T.

Book ID: 125844134
Publisher: IEEE
Year: 2004
Weight: 138 KB
Category: Article
ISBN-13: 9780780383159
DOI: 10.1109/RELPHY.2004.1315443

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