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[IEEE 2004 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Grapevine, TX, USA (2004.09.19-2004.09.23)] 2004 Electrical Overstress/Electrostatic Discharge Symposium - Advanced ESD rail clamp network design for high voltage CMOS applications

✍ Scribed by Stockinger, Michael; Miller, James W.

Book ID: 126742418
Publisher: IEEE
Year: 2004
Weight: 593 KB
Category: Article
DOI: 10.1109/EOSESD.2004.5272599

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