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[IEEE 2004 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Grapevine, TX, USA (2004.09.19-2004.09.23)] 2004 Electrical Overstress/Electrostatic Discharge Symposium - ESD protection solutions for high voltage technologies

✍ Scribed by Keppens, Bart; Mergens, Markus P.J.; Trinh, Cong Son; Russ, Christian C.; Van Camp, Benjamin; Verhaege, Koen G.

Book ID: 126600422
Publisher: IEEE
Year: 2004
Weight: 323 KB
Category: Article
DOI: 10.1109/EOSESD.2004.5272593

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