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[IEEE 2004 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Grapevine, TX, USA (2004.09.19-2004.09.23)] 2004 Electrical Overstress/Electrostatic Discharge Symposium - Formation and suppression of a newly discovered secondary EOS event in HBM test systems

✍ Scribed by Meuse, Tom; Ting, Larry; Schichl, Joe; Barrett, Robert; Bennett, David; Cline, Roger; Duvvury, Charvaka; Hopkins, Michael; Kunz, Hans; Leiserson, John; Steinhoff, Robert

Book ID: 126721557
Publisher: IEEE
Year: 2004
Weight: 303 KB
Category: Article
DOI: 10.1109/EOSESD.2004.5272618

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