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[IEEE 2004 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Grapevine, TX, USA (2004.09.19-2004.09.23)] 2004 Electrical Overstress/Electrostatic Discharge Symposium - Optimization of broadband RF performance and ESD robustness by π-model distributed ESD protection scheme

✍ Scribed by Ker, Ming-Dou; Kuo, Bing-Jye

Book ID: 126659910
Publisher: IEEE
Year: 2004
Weight: 835 KB
Category: Article
DOI: 10.1109/EOSESD.2004.5272640

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