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[IEEE 2004 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Grapevine, TX, USA (2004.09.19-2004.09.23)] 2004 Electrical Overstress/Electrostatic Discharge Symposium - Design on latchup-free power-rail ESD clamp circuit in high-voltage CMOS ICs

✍ Scribed by Lin, Kun-Hsien; Ker, Ming-Dou

Book ID: 126674291
Publisher: IEEE
Year: 2004
Weight: 376 KB
Category: Article
DOI: 10.1109/EOSESD.2004.5272601

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