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[IEEE 2004 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Grapevine, TX, USA (2004.09.19-2004.09.23)] 2004 Electrical Overstress/Electrostatic Discharge Symposium - Voltages before and after HBM stress and their effect on dynamically triggered power supply clamps

✍ Scribed by Ashton, R. A.; Weir, B. E.; Weiss, G.; Meuse, T.

Book ID: 126721556
Publisher: IEEE
Year: 2004
Weight: 128 KB
Category: Article
DOI: 10.1109/EOSESD.2004.5272616

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