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[IEEE 2003 8th International Symposium on Plasma- and Process-Induced Damage - Corbeil-Essonnes, France (24-25 April 2003)] 2003 8th International Symposium Plasma- and Process-Induced Damage. - Plasma-induced charging in two bit per cell SONOS memories

✍ Scribed by Roizin, Y.; Gutman, M.; Yosefi, R.; Alfassi, S.; Aloni, E.

Book ID: 126639852
Publisher: IEEE
Year: 2003
Weight: 479 KB
Category: Article
ISBN-13: 9780780377479
DOI: 10.1109/PPID.2003.1200914

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