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[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - High-performance chip reliability from short-time-tests-statistical models for optical interconnect and HCI/TDDB/NBTI deep-submicron transistor failures

✍ Scribed by Haggag, A.; McMahon, W.; Hess, K.; Cheng, K.; Lee, J.; Lyding, J.

Book ID: 121219679
Publisher: IEEE
Year: 2001
Weight: 1010 KB
Category: Article
ISBN-13: 9780780365872
DOI: 10.1109/RELPHY.2001.922913

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