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[IEEE 2000 IEEE International SOI Conference. Proceedings - Wakefield, MA, USA (2-5 Oct. 2000)] 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) - Impact of the gate-to-body tunneling current on SOI history effect

✍ Scribed by Fung, S.K.H.; Zamdmer, N.; Yang, I.; Sherony, M.; Shih-Hsieh Lo, ; Wagner, L.; Chen, T.-C.; Shahidi, G.; Assaderaghi, F.

Book ID: 126767568
Publisher: IEEE
Year: 2000
Weight: 152 KB
Category: Article
ISBN-13: 9780780363892
DOI: 10.1109/SOI.2000.892800

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