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[IEEE 2000 IEEE International SOI Conference. Proceedings - Wakefield, MA, USA (2-5 Oct. 2000)] 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) - Hall mobility measurement in double-gate SOI MOSFETs

✍ Scribed by Vandooren, A.; Cristoloveanu, S.; Colinge, J.P.

Book ID: 121324471
Publisher: IEEE
Year: 2000
Weight: 165 KB
Edition: 2000
Category: Article
ISBN-13: 9780780363892
DOI: 10.1109/SOI.2000.892798

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