𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2000 IEEE International SOI Conference. Proceedings - Wakefield, MA, USA (2-5 Oct. 2000)] 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) - High performance 0.1 μm partially depleted SOI CMOSFET

✍ Scribed by Yeh, W.K.; Chiutsung Huang, ; Chen, T.F.; Hsu, S.M.; Jiann Liu, ; Lin, C.H.; Liou, F.T.

Book ID: 125485050
Publisher: IEEE
Year: 2000
Weight: 189 KB
Edition: 2000
Category: Article
ISBN-13: 9780780363892
DOI: 10.1109/SOI.2000.892773

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2000 IEEE International SOI Confer

[IEEE 2000 IEEE International SOI Conference. Proceedings - Wakefield, MA, USA (2-5 Oct. 2000)] 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) - Hall mobility measurement in double-gate SOI MOSFETs

✍ Vandooren, A.; Cristoloveanu, S.; Colinge, J.P. 📂 Article 📅 2000 🏛 IEEE ⚖ 165 KB

[IEEE 2000 IEEE International SOI Confer

[IEEE 2000 IEEE International SOI Conference. Proceedings - Wakefield, MA, USA (2-5 Oct. 2000)] 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) - SOI MOSFET thermal conductance and its geometry dependence

✍ Nakayama, H.; Nakamura, M.; Komatsu, H.; Chenming Hu, 📂 Article 📅 2000 🏛 IEEE ⚖ 184 KB

[IEEE 2000 IEEE International SOI Confer

[IEEE 2000 IEEE International SOI Conference. Proceedings - Wakefield, MA, USA (2-5 Oct. 2000)] 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) - Circuit design in SOI: concept of floating β ratio

✍ Tretz, C.R. 📂 Article 📅 2000 🏛 IEEE ⚖ 224 KB

[IEEE 2000 IEEE International SOI Confer

[IEEE 2000 IEEE International SOI Conference. Proceedings - Wakefield, MA, USA (2-5 Oct. 2000)] 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) - Proposal of sub 0.1 μm SOI MOSFET structure (partial-ground-plane SOI MOSFET) for RF/digital applications

✍ Nakakubo, A.; Yanagi, S.-I.; Omura, Y. 📂 Article 📅 2000 🏛 IEEE ⚖ 140 KB

[IEEE 2000 IEEE International SOI Confer

[IEEE 2000 IEEE International SOI Conference. Proceedings - Wakefield, MA, USA (2-5 Oct. 2000)] 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) - Impact of the gate-to-body tunneling current on SOI history effect

✍ Fung, S.K.H.; Zamdmer, N.; Yang, I.; Sherony, M.; Shih-Hsieh Lo, ; Wagner, L.; C 📂 Article 📅 2000 🏛 IEEE ⚖ 152 KB

[IEEE 2000 IEEE International SOI Confer

[IEEE 2000 IEEE International SOI Conference. Proceedings - Wakefield, MA, USA (2-5 Oct. 2000)] 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) - An impact of GIDL off leakage on low-power sub-0.2 μm SOI CMOS applications

✍ Kotani, N.; Ito, S.; Yasui, T.; Hori, T. 📂 Article 📅 2000 🏛 IEEE ⚖ 139 KB