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[IEEE 2000 IEEE International SOI Conference. Proceedings - Wakefield, MA, USA (2-5 Oct. 2000)] 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) - SOI MOSFET thermal conductance and its geometry dependence

✍ Scribed by Nakayama, H.; Nakamura, M.; Komatsu, H.; Chenming Hu,

Book ID: 125435914
Publisher: IEEE
Year: 2000
Weight: 184 KB
Edition: 2000
Category: Article
ISBN-13: 9780780363892
DOI: 10.1109/soi.2000.892803

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