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[IEEE 2000 IEEE International SOI Conference. Proceedings - Wakefield, MA, USA (2-5 Oct. 2000)] 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) - An impact of GIDL off leakage on low-power sub-0.2 μm SOI CMOS applications

✍ Scribed by Kotani, N.; Ito, S.; Yasui, T.; Hori, T.

Book ID: 118267595
Publisher: IEEE
Year: 2000
Weight: 139 KB
Edition: 2000
Volume: 0
Category: Article
ISBN-13: 9780780363892
DOI: 10.1109/soi.2000.892784

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