𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2000 IEEE Hong Kong Electron Devices Meeting - Hong Kong, China (24 June 2000)] Proceedings 2000 IEEE Hong Kong Electron Devices Meeting (Cat. No.00TH8503) - Characterization of MOS structure inversion and accumulation layer by approximate solution of Schrodinger equation

✍ Scribed by Yutao Ma, ; Litian Liu, ; Lilin Tian, ; Zhiping Yu, ; Zhijian Li,

Book ID: 123621271
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 259 KB
Edition: 2000 ed.
Category: Article
ISBN-13: 9780780363045
DOI: 10.1109/HKEDM.2000.904232

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2000 IEEE Hong Kong Electron Devic

[IEEE 2000 IEEE Hong Kong Electron Devices Meeting - Hong Kong, China (24 June 2000)] Proceedings 2000 IEEE Hong Kong Electron Devices Meeting (Cat. No.00TH8503) - Measurement of Young's modulus of nickel silicide film by a surface profiler

✍ Ming Qin, ; Yuen, C.Y.; Poon, M.C.; Chan, W.Y. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 285 KB

[IEEE 2000 IEEE Hong Kong Electron Devic

[IEEE 2000 IEEE Hong Kong Electron Devices Meeting - Hong Kong, China (24 June 2000)] Proceedings 2000 IEEE Hong Kong Electron Devices Meeting (Cat. No.00TH8503) - A self-aligned structure AlGaAs/GaAs HBT's using silicon nitride sidewall technique

✍ Bei Ping Yan, ; Yang, E.S. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 310 KB

[IEEE 2000 IEEE Hong Kong Electron Devic

[IEEE 2000 IEEE Hong Kong Electron Devices Meeting - Hong Kong, China (24 June 2000)] Proceedings 2000 IEEE Hong Kong Electron Devices Meeting (Cat. No.00TH8503) - Effect of electric field on the energy levels of two interacting electrons in a quantum dot

✍ Chakraborty, C.; Lai, P.T.; Chakraborty, S. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 245 KB

[IEEE 2000 IEEE Hong Kong Electron Devic

[IEEE 2000 IEEE Hong Kong Electron Devices Meeting - Hong Kong, China (24 June 2000)] Proceedings 2000 IEEE Hong Kong Electron Devices Meeting (Cat. No.00TH8503) - A new RF capacitance method to extract the effective channel length of MOSFET's using S-parameters

✍ Seonghearn Lee, 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 248 KB

[IEEE 2001 IEEE Hong Kong Electron Devic

[IEEE 2001 IEEE Hong Kong Electron Devices Meeting - Hong Kong, China (30 June 2001)] Proceedings 2001 IEEE Hong Kong Electron Devices Meeting (Cat. No.01TH8553) - Characterization of piezoelectric ring used for wire bonding transducer application

✍ Kei Chun Cheng, ; Chan, H.L.W. 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 288 KB

[IEEE 2001 IEEE Hong Kong Electron Devic

[IEEE 2001 IEEE Hong Kong Electron Devices Meeting - Hong Kong, China (30 June 2001)] Proceedings 2001 IEEE Hong Kong Electron Devices Meeting (Cat. No.01TH8553) - Direct electrical characterization of metal-induced-lateral-crystallization regions by spreading resistance probe measurements

✍ Leung, T.C.; Cheng, C.F.; Myasnikov, A.M.; Poon, M.C. 📂 Article 📅 2001 🏛 IEEE ⚖ 533 KB