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[IEEE 2001 IEEE Hong Kong Electron Devices Meeting - Hong Kong, China (30 June 2001)] Proceedings 2001 IEEE Hong Kong Electron Devices Meeting (Cat. No.01TH8553) - Direct electrical characterization of metal-induced-lateral-crystallization regions by spreading resistance probe measurements

✍ Scribed by Leung, T.C.; Cheng, C.F.; Myasnikov, A.M.; Poon, M.C.

Book ID: 126734276
Publisher: IEEE
Year: 2001
Weight: 533 KB
Category: Article
ISBN-13: 9780780367142
DOI: 10.1109/HKEDM.2001.946936

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