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[IEEE 2000 5th International Workshop on Statistical Metrology - Honolulu, HI, USA (11 June 2000)] 2000 5th International Workshop on Statistical Metrology (Cat.No.00TH8489 - Device robust-design using multiple-response optimization technique

✍ Scribed by Chen, M.-R.; Chiang, P.; Lin, L.

Book ID: 126752332
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 321 KB
Edition: 2000
Category: Article
ISBN-13: 9780780358966
DOI: 10.1109/IWSTM.2000.869310

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