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[IEEE 2000 5th International Workshop on Statistical Metrology - Honolulu, HI, USA (11 June 2000)] 2000 5th International Workshop on Statistical Metrology (Cat.No.00TH8489 - An efficient statistical model using electrical tests for GHz CMOS devices

✍ Scribed by Sang-Hoon Lee, ; Dong-Yun Lee, ; Tae-Jin Kwon, ; Joo-Hee Lee, ; Young-Kwan Park, ; Bum-Sik Kim, ; Jeong-Taek Kong,

Book ID: 120617014
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 335 KB
Edition: 2000
Category: Article
ISBN-13: 9780780358966
DOI: 10.1109/IWSTM.2000.869315

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