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[IEEE 2000 5th International Workshop on Statistical Metrology - Honolulu, HI, USA (11 June 2000)] 2000 5th International Workshop on Statistical Metrology (Cat.No.00TH8489 - Statistical BSIM3 model parameter extraction and fast/slow model parameter determination for high speed SRAM parametric yield estimation

✍ Scribed by Miyama, M.; Kamohara, S.; Nakura, K.; Shinozaki, M.; Akioka, T.; Okuyama, K.; Kubota, K.

Book ID: 118172887
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 353 KB
Edition: 2000
Volume: 0
Category: Article
ISBN-13: 9780780358966
DOI: 10.1109/iwstm.2000.869309

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