𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2000 5th International Workshop on Statistical Metrology - Honolulu, HI, USA (11 June 2000)] 2000 5th International Workshop on Statistical Metrology (Cat.No.00TH8489 - Variations of interconnect capacitance and RC delay induced by process fluctuations

✍ Scribed by Shigyo, N.

Book ID: 120827624
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 265 KB
Edition: 2000
Category: Article
ISBN-13: 9780780358966
DOI: 10.1109/IWSTM.2000.869314

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2000 5th International Workshop on

[IEEE 2000 5th International Workshop on Statistical Metrology - Honolulu, HI, USA (11 June 2000)] 2000 5th International Workshop on Statistical Metrology (Cat.No.00TH8489 - Impact of interconnect parameter variations on wire-tree delay

✍ Bhavnagarwala, A.J.; Kapoor, A.; Meindl, J.D. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 375 KB

[IEEE 2000 5th International Workshop on

[IEEE 2000 5th International Workshop on Statistical Metrology - Honolulu, HI, USA (11 June 2000)] 2000 5th International Workshop on Statistical Metrology (Cat.No.00TH8489 - Statistical circuit modeling and optimization

✍ Duvall, S.G. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 982 KB

[IEEE 2000 5th International Workshop on

[IEEE 2000 5th International Workshop on Statistical Metrology - Honolulu, HI, USA (11 June 2000)] 2000 5th International Workshop on Statistical Metrology (Cat.No.00TH8489 - Device robust-design using multiple-response optimization technique

✍ Chen, M.-R.; Chiang, P.; Lin, L. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 321 KB

[IEEE 2000 5th International Workshop on

[IEEE 2000 5th International Workshop on Statistical Metrology - Honolulu, HI, USA (11 June 2000)] 2000 5th International Workshop on Statistical Metrology (Cat.No.00TH8489 - An efficient statistical model using electrical tests for GHz CMOS devices

✍ Sang-Hoon Lee, ; Dong-Yun Lee, ; Tae-Jin Kwon, ; Joo-Hee Lee, ; Young-Kwan Park, 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 335 KB

[IEEE 2000 5th International Workshop on

[IEEE 2000 5th International Workshop on Statistical Metrology - Honolulu, HI, USA (11 June 2000)] 2000 5th International Workshop on Statistical Metrology (Cat.No.00TH8489 - Accurate prediction of IC manufacturing distributions using improved response surface fitting

✍ Nilsen, V.K.; Walton, A.J. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 282 KB

[IEEE 2000 5th International Workshop on

[IEEE 2000 5th International Workshop on Statistical Metrology - Honolulu, HI, USA (11 June 2000)] 2000 5th International Workshop on Statistical Metrology (Cat.No.00TH8489 - Statistical BSIM3 model parameter extraction and fast/slow model parameter determination for high speed SRAM parametric yield estimation

✍ Miyama, M.; Kamohara, S.; Nakura, K.; Shinozaki, M.; Akioka, T.; Okuyama, K.; Ku 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 353 KB