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[IEEE 1997 IEEE International Conference on Microelectronic Test Structures Proceedings - Monterey, CA, USA (17-20 March 1997)] 1997 IEEE International Conference on Microelectronic Test Structures Proceedings - New method for the parameter extraction in Si MOSFETs after hot carrier injection

✍ Scribed by Hardillier, S.; Mourrain, C.; Bouzid, M.J.; Ghibaudo, G.

Book ID: 126687686
Publisher: IEEE
Year: 1997
Weight: 238 KB
Category: Article
ISBN-13: 9780780332430
DOI: 10.1109/ICMTS.1997.589336

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